Apertura |
Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed) |
Espacio en disco disponible |
2GB |
Calibración |
Manual on external ceramic white reference (included) |
Interfaz de comunicación |
USB 1.1 |
Conectividad |
Powered USB port |
Dimensiones (largo, ancho, alto) |
i1Pro device: 162 mm x 69 mm x 64 mm (6.4” x 2.7” x 2.5”) |
Resolución de la pantalla |
1024x768 pixels or higher |
Nivel de experiencia |
Intermediate to Advanced |
Humedad |
30 to 85% RH (non-condensing) |
Tamaño del área de iluminación |
3 mm (0.12”) |
Acuerdo entre instrumentos |
0.3 ∆E00* average, 0.8 ∆E00* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º)) |
Conexión a Internet |
Required for software install, download and automatic update |
Idiomas compatibles |
Chinese (Simplified), English, French, German, Italian, Japanese, Korean, Portuguese, Spanish |
Fuente de luz |
i1Pro3 Plus LED Illumination (including UV) |
Macintosh |
MacOS X 10.11x, 10.12x, 10.13x, 10.15 (with latest upgrades installed) |
Condiciones de medición |
• M0 - UV included - ISO 13655:2017
• M1 - D50 - ISO 13655:2017
• M2 - UV excluded Filter - ISO 13655:2017 |
Frecuencia de la medición en el modo de escaneo |
400 measurements per second |
Geometría de medición |
45°/0° ring illumination optics, ISO 13655:2017 |
Media Thickness |
1mm or less |
Memoria |
2GB Minimum |
Cantidad de pantallas admitidas por estación de trabajo |
Up to 4 |
Rango de temperatura de operación |
10°C to 35°C
50°F to 95°F |
Tamaño del parche |
Minimal Patch Size in Scanning Mode: 7 x 7 mm (0.28” x 0.28”) (Width x Height) with sensor ruler 10 x 7 mm (0.40” x 0.28”) (Width x Height) without sensor ruler |
Rango fotométrico |
10nm; Sampling interval 3.5nm |
Procesador |
MAC: Intel® Core 2 Duo CPU or better; WINDOWS: Intel® Core 2 Duo or AMD Athlon™ XP or better |
Longitud de escaneo |
Maximum 260mm (10.24") |
Compatible con el objetivo del escáner |
Yes |
Capacidad de escaneo |
Yes |
Seguridad |
User must have Administrator rights to install and uninstall the application |
Repetitividad de corto plazo: blanco |
0.05 dE00 on white (D50,2°, mean of 10 measurements every 3 seconds on white) |
Escaneo en una pasada |
Yes |
Kit de desarrollo de software |
Available for OEM customers |
Modos de software |
Basic & Advanced |
Analizador de espectro |
i1® technology with built-in wavelengths check; Holographic diffraction grating with 128-pixel diode array |
Intervalo espectral |
380 - 730 nm |
Presentación del espectro |
380 ... 730 nm in 10 nm steps
|
Rango de temperatura de almacenamiento |
-20° to 50°C
-4° to 122°F |
Formato de perfil compatible |
ICC version 2, version 4.3, & iccMax |
Unité de couleur |
Black/Silver |
Experiencia de usuario |
Choose between a ‘basic’, wizard-driven interface or an ‘advanced’, user-driven interface for highest level professional results |
Tarjeta de video |
MAC: Latest drivers for video card installed;
WINDOWS: Latest drivers for video card installed, dual display support requires either 2 video cards or a dual head video card that supports dual video LUTs being loaded |
Garantía |
Twelve (12) months from the date of sale, unless different local regulations apply. Product registration is required to receive X-Rite technical support during the warranty period. Registration can occur directly through the software, on our website, or via phone. Users are encouraged to register their product within the first 30 days of use. |
Peso |
i1Pro device: 285 g (10.1 oz) |
¿Qué incluye? |
i1Pro 3 Plus spectrophotometer (measurement device), calibration plate, ambient light measurement head, monitor holder, positioning target, scanning ruler, backer board, USB cable. i1Profiler v3.x software for monitor profiling plus QA for monitors and printers. |
Windows |
Windows 7, 8, 8.1, 10 (with latest Service Pack installed) |