| Blende | Measurement aperture: 8 mm (0.31”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed) |
|---|---|
| Verfügbarer Festplattenspeicher | 2GB |
| Kalibrierung | Manual on external ceramic white reference (included) |
| Kommunikationsschnittstelle | USB 1.1 |
| Konnektivität | Powered USB port |
| Abmessungen (Länge, Breite, Höhe) | i1Pro device: 162 mm x 69 mm x 64 mm (6.4” x 2.7” x 2.5”) |
| Display-Auflösung | 1024x768 pixels or higher |
| Kenntnisstand | Intermediate to Advanced |
| Luftfeuchtigkeit | 30 to 85% RH (non-condensing) |
| Größe des Beleuchtungspunkts | 12 mm (0.47”) |
| Geräteübereinstimmung | 0.3 ∆E00* average, 0.8 ∆E00* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º)) |
| Internetverbindung | Required for software install, download and automatic update |
| Unterstützte Sprachen | Chinese (Simplified), English, French, German, Italian, Japanese, Korean, Portuguese, Spanish |
| Lichtquelle | i1Pro3 Plus LED Illumination (including UV) |
| Macintosh | MacOS X 10.13x, 10.14x or 10.15x (with latest upgrades installed) |
| Messbedingungen | • M0 - UV included - ISO 13655:2017 • M1 - D50 - ISO 13655:2017 • M2 - UV excluded Filter - ISO 13655:2017 • M3 - Polarization - ISO 13655:2017 |
| Messfrequenz im Scanmodus | 400 measurements per second |
| Messgeometrie | 45°:0° ring illumination optics, ISO 13655:2017 |
| Messfleck | 8mm (0.315”) |
| Media Thickness | 1mm or less |
| Speicher | 2GB Minimum |
| Anzahl der pro Workstation unterstützten Displays | Up to 4 |
| Betriebstemperatur | 10°C to 35°C 50°F to 95°F |
| Messfeldgröße | Minimal Patch Size in Scanning Mode: 16 x 16 mm (0.63” x 0.63”) (Width x Height) with sensor ruler 20 x 16 mm (0.79” x 0.63”) (Width x Height) without sensor ruler |
| Photometrischer Bereich | 10nm; Sampling interval 3.5nm |
| Prozessor | MAC: Intel® Core 2 Duo CPU or better; WINDOWS: Intel® Core 2 Duo or AMD Athlon™ XP or better |
| Scanlänge | Maximum 515mm (20.28") |
| Unterstützung von Scannertestcharts | Yes |
| Scanfunktionen | Yes |
| Sicherheit | User must have Administrator rights to install and uninstall the application |
| Kurzzeitwiederholgenauigkeit - Weiß | 0.05 ∆E00 on white (D50,2°, mean of 10 measurements every 3 seconds on white)5 |
| SDK (Software Development Kit) | Available for OEM customers |
| Spektralanalysesystem | i1® technology with built-in wavelengths check; Holographic diffraction grating with 128-pixel diode array |
| Spektralbereich | 380 - 730 nm |
| Spektralbericht | 380 ... 730 nm in 10 nm steps |
| Lagerungstemperatur | -20° to 50°C -4° to 122°F |
| Unterstütztes Profilformat | ICC version 2, version 4.3, & iccMax |
| Gerätefarbe | Black/Silver |
| User Experience | Choose between a ‘basic’, wizard-driven interface or an ‘advanced’, user-driven interface for highest level professional results |
| Grafikkarte | MAC: Latest drivers for video card installed WINDOWS: Latest drivers for video card installed, dual display support requires either 2 video cards or a dual head video card that supports dual video LUTs being loaded |
| Garantie | Twelve (12) months from the date of sale, unless different local regulations apply. Product registration is required to receive X-Rite technical support during the warranty period. Registration can occur directly through the software, on our website, or via phone. Users are encouraged to register their product within the first 30 days of use. |
| Gewicht | i1Pro device: 285 g (10.1 oz) |
| Lieferumfang | i1Pro 3 Plus spectrophotometer (measurement device), calibration plate, polarizing filter, ambient light measurement head, monitor holder, positioning target, XL scanning ruler, XL backer board, USB cable. i1Profiler v3.x software for monitor profiling plus QA for monitors and printers. |
| Windows | Windows 7, 8, 8.1, 10 (with latest Service Pack installed) |
