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XRite
N. modello : eobas

i1Basic Pro

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Upgrade Comparison

i1Basic Pro

i1Basic Pro 3

Apertura Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed) 
Spazio su disco disponibile 2GB
Calibrazione Manual on external ceramic white reference (included)
Interfaccia di comunicazione USB 1.1
Connettività Powered USB port
Dimensioni (lunghezza, larghezza, altezza) i1Pro device: 162 mm x 69 mm x 64 mm (6.4” x 2.7” x 2.5”)
Risoluzione display 1024x768 pixels or higher
Livello di esperienza Intermediate to Advanced
Umidità 30 to 85% RH (non-condensing)
Dimensioni spot di illuminazione 3 mm (0.12”)
Compatibilità tra strumenti 0.3 ∆E00* average, 0.8 ∆E00* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º))
Connessione Internet Required for software install, download and automatic update
Lingue supportate Chinese (Simplified), English, French, German, Italian, Japanese, Korean, Portuguese, Spanish
Sorgente luminosa i1Pro3 Plus LED Illumination (including UV)
Macintosh MacOS X 10.11x, 10.12x, 10.13x, 10.15 (with latest upgrades installed)
Condizioni di misurazione • M0 - UV included - ISO 13655:2017
• M1 - D50 - ISO 13655:2017 
• M2 - UV excluded Filter - ISO 13655:2017
Frequenza di misurazione in modalità scansione 400 measurements per second
Geometria di misurazione 45°/0° ring illumination optics, ISO 13655:2017
Media Thickness 1mm or less
Memoria 2GB Minimum
Numero di display supportati per workstation Up to 4
Intervallo temperatura operativa 10°C to 35°C
50°F to 95°F
Dimensione campione Minimal Patch Size in Scanning Mode: 7 x 7  mm (0.28” x 0.28”) (Width x Height) with sensor ruler 10 x 7 mm (0.40” x 0.28”) (Width x Height) without sensor ruler
Campo fotometrico 10nm; Sampling interval 3.5nm
Processore MAC: Intel® Core 2 Duo CPU or better; WINDOWS: Intel® Core 2 Duo or AMD Athlon™ XP or better
Lunghezza scansione Maximum 260mm (10.24")
Supporto target per scanner Yes
Funzionalità di scansione Yes
Sicurezza User must have Administrator rights to install and uninstall the application
Ripetibilità a breve termine - Bianco 0.05 dE00 on white (D50,2°, mean of 10 measurements every 3 seconds on white)
Scansione in un unico passaggio Yes
Kit di sviluppo software Available for OEM customers
Modalità software Basic & Advanced
Analizzatore di spettro i1® technology with built-in wavelengths check; Holographic diffraction grating with 128-pixel diode array
Gamma spettrale 380 - 730 nm
Reporting di spettro 380 ... 730 nm in 10 nm steps
 
Intervallo temperatura di immagazzinamento -20° to 50°C
-4° to 122°F
Formato profilo supportato ICC version 2, version 4.3,  & iccMax
Colore unità Black/Silver
Esperienza utente Choose between a ‘basic’, wizard-driven interface or an ‘advanced’, user-driven interface for highest level professional results
Scheda video

MAC: Latest drivers for video card installed;

WINDOWS: Latest drivers for video card installed, dual display support requires either 2 video cards or a dual head video card that supports dual video LUTs being loaded
Garanzia Twelve (12) months from the date of sale, unless different local regulations apply. Product registration is required to receive X-Rite technical support during the warranty period. Registration can occur directly through the software, on our website, or via phone. Users are encouraged to register their product within the first 30 days of use.
Peso i1Pro device: 285 g (10.1 oz)
Contenuto i1Pro 3 Plus spectrophotometer (measurement device), calibration plate, ambient light measurement head, monitor holder, positioning target,  scanning ruler, backer board, USB cable.  i1Profiler v3.x software for monitor profiling plus QA for monitors and printers.
Windows Windows 7, 8, 8.1, 10 (with latest Service Pack installed)
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