短期繰り返し精度 - ホワイト |
0.1 DE*94 (D50, 2°) |
器差 |
Average 0.4 DE*94 (deviation from X-Rite manufacturing standard at a temperature of 23°C on 12 BCRA tiles (D50, 2°)) |
測定条件 |
M0, M1 & M2 |
最少の用紙の厚さ |
Typical 0.16mm, Range: 0.08 to 0.45mm |
分光範囲 |
10 nm; Sampling interval 3.5 nm (100 bands) |
分光システム |
i1® technology (holographic diffraction grating with diode array) |
分光範囲 |
380 - 730 nm |
分光レポート出力 |
10 nm |
測定アパーチャー |
Effective measurement aperture during scanning is depending on the patch size |
本体カラー |
Silver/Black |
製品寸法(奥行/幅/高さ) |
Width 42 cm, depth 16 cm, height 12 cm (16.5 x 6.3 x 4.7 inches) |
重量 |
3.2 kg (112.9 oz) |
インターフェース |
USB |
対象用途 |
Intermediate to Advanced |
ソフトウェア開発キット |
Available for OEM customers |
用紙サイズ |
A4+
Width: 6 to 23 cm (2.4 to 9 in.)
Length: 17 cm to 66 cm (6.7 to 26 in.) |
キャリブレーション |
Automatic on Internal Calibration Reference |
蛍光増白剤補正(OBC) |
Optical Brightener Compensation (OBC) with i1Profiler software |
製品保証 |
Twelve (12) months from the date of sale, unless different local regulations apply. Product registration is required to receive X-Rite technical support during the warranty period. Registration can occur directly through the software, on our website, or via phone. Users are encouraged to register their product within the first 30 days of use. |
同梱物 |
i1iSis 2 spectrophotometer; main power cable, USB cable |
接続方法 |
Powered USB port |